Defect Measuring Instrument - メーカー・企業と製品の一覧

Crystal Defect Measurement Device (Light Scattering Tomography)

Crystal Defect Measurement Device (Light Scattering Tomography)

Crystal defects in silicon wafers can be measured quickly.

• 企業：日本セミラボ 新横浜本社
• 価格：Other

• Semiconductor inspection/test equipment
• Other electronic measuring instruments
• Analytical Equipment and Devices